Researchers have developed a new approach for studying piezoelectric materials using ultrafast 3-D X-ray imaging and computer modeling. Their integrated approach can help us better understand material behavior and engineer more powerful and energy-efficient technologies.
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Mathew J. Cherukara, Kiran Sasikumar, Wonsuk Cha, Badri Narayanan, Steven J. Leake, Eric M. Dufresne, Tom Peterka, Ian McNulty, Haidan Wen, Subramanian K. R. S. Sankaranarayanan, Ross J. Harder. Ultrafast Three-Dimensional X-ray Imaging of Deformation Modes in ZnO Nanocrystals. Nano Letters, 2017; 17 (2): 1102 DOI: 10.1021/acs.nanolett.6b04652
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Mathew J. Cherukara, Kiran Sasikumar, Wonsuk Cha, Badri Narayanan, Steven J. Leake, Eric M. Dufresne, Tom Peterka, Ian McNulty, Haidan Wen, Subramanian K. R. S. Sankaranarayanan, Ross J. Harder. Ultrafast Three-Dimensional X-ray Imaging of Deformation Modes in ZnO Nanocrystals. Nano Letters, 2017; 17 (2): 1102 DOI: 10.1021/acs.nanolett.6b04652
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